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Basic Science Products
Life Sciences Software
BESANÇON, France, Sept. 17, 2012 — For surface imaging and metrology compatible with scanning electron microscopes (SEMs) and multispectral Raman instruments, Digital Surf has announced a new generation of Mountains 7 software. Compatibility with scanning profilometers and form measuring systems was assured in the first release, and compatibility with scanning probe microscopes, confocal microscopes and optical interferometric microscopes was introduced in the second. Now, Mountains 7 SEM software can be used to...
Digital Surf
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Kelvin Probe Force Microscopy
SANTA BARBARA, Calif., Aug. 28, 2012 — Bruker Corp. has released the PeakForce Kelvin Probe Force Microscopy (KPFM) mode for its line of atomic force microscopes (AFMs). It uses frequency-modulation detection to provide high-spatial-resolution Kelvin probe data. It builds on...
Bruker Nano Surfaces
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Titan ETEM G2
HILLSBORO, Ore., Aug. 13, 2012 — FEI has released the Titan ETEM G2, an environmental transmission electron microscope (ETEM) that enables time-resolved in situ studies of processes and materials exposed to reactive gases and elevated temperatures. Developers of energy and...
FEI, North America NanoPort
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eXcelon3 EMCCD Technology
TRENTON, N.J., Aug. 10, 2012 — Princeton Instruments has introduced the next generation of its eXcelon technology for electron-multiplying (EM) CCDs. The eXcelon3 technology provides high sensitivity and improved fringe suppression. In 2010, the company introduced advanced...
Teledyne Princeton Instruments
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Atomic Force Microscope
PHOENIX, Aug. 6, 2012 — Bruker Corp. has announced the Dimension FastScan Bio atomic force microscope (AFM), which enables high-resolution microscopy research in biological dynamics. Design innovations have resulted in a fast-scanning AFM that allows temporal investigation...
Bruker AXS Inc.
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Blue Tunable Lasers
SANTA CLARA, Calif., June 27, 2012 — New Focus, a Newport Corp. brand, has introduced the Vortex Plus Blue TLB-6802 series single-mode finely tunable lasers. The precision direct-diode blue lasers operate at 461 nm, the critical wavelength for next-generation atomic clocks that are...
Newport - New Focus
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Image Analysis Software
WETZLAR, Germany, April 2, 2012 — Leica Microsystems has released its Tissue 1A 2.0, high-performance image analysis software for discovery research applications, and for capture, management and analysis of digital pathology images. Combining fluorescence and bright-field...
Leica Microsystems GmbH
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Triple Isotope Analyzer
MOUNTAIN VIEW, Calif., Feb. 21, 2012 — Los Gatos Research has introduced a triple isotope analyzer for direct simultaneous measurement of δ17O, δ18O and δ2H ratios in liquid water and water vapor samples. The IWA-46EP is capable of automated, continuous or batch...
Los Gatos Research Inc. (LGR)
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Negative-Stiffness Optical Table
INGLEWOOD, Calif., Feb. 7, 2012 — In collaboration with Kinetic Systems Inc., Minus K Technology has released an ultralow natural frequency optical table isolation system for Raman spectroscopy, atomic force microscopy (AFM), AFM-Raman integration and microhardness testing. ...
Minus K Technology Inc.
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CMOS Camera
Feb 1, 2012 — Raptor Photonics Ltd. has introduced a 4.2-megapixel cooled scientific CMOS camera. The Osprey OS4MPc-CL features a 2k x 2k low-noise 2048 x 2048-pixel scientific CMOS sensor that produces high sensitivity, high resolution, high speed and good...
Raptor Photonics Ltd.
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Integrated AFM Platform
Feb 1, 2012 — Anasys Instruments Corp. has launched the afm+, a fully integrated atomic force microscopy (AFM) platform for research and analysis. Using thermal probe technology for nanoscale thermal analysis (nano-TA), the afm+ allows the user to obtain...
Anasys Instruments Corp.
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Polymer Measurement
Feb 1, 2012 — B&W Tek Inc. and Gnosys Global Ltd. have introduced the PolymerIQ software for real-time nondestructive identification and quantification of polymers. Combining B&W Tek's i-Raman high-resolution portable Raman spectrometer system with...
B&W Tek LLC
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QI for AFM System
Feb 1, 2012 — JPK Instruments has announced new quantitative imaging (QI) capabilities for the recently launched NanoWizard 3 atomic force microscopy (AFM) system. The QI mode was developed by the company to facilitate AFM imaging. With QI, a force curve-based...
Bruker Nano GmbH, JPK BioAFM
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Variable Field Module
Feb 1, 2012 — For applications with MFP-3D atomic force microscopes (AFMs), Asylum Research has introduced the variable field module2 (VFM2), intended for use by researchers who want to apply magnetic fields to their atomic force microscopy experiments. It...
Oxford Instruments Asylum Research
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Image Sensor
MILPITAS, Calif., Jan. 27, 2012 — BAE Systems Imaging Solutions has introduced the Fairchild Imaging CIS1021 scientific CMOS (sCMOS) image sensor. As a high-definition camera component designed for collecting images through a microscope or other imaging system, the sensor chip can...
BAE Systems Sensor Solutions
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Ultrahigh-Power Single-Mode Laser Diodes
NORTH BRUNSWICK, N.J., Jan. 18, 2012 — Intense Inc. has released a 300-mW version of its Series 6030 and Series 6130 ultrahigh-power, high-brightness single-mode laser diodes. Designed for defense, medical and print/imaging applications such as spectroscopy and industrial coding, the...
Intense Inc.
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FireWire-b Digital Cameras
RICHMOND, British Columbia, Canada, Jan. 17, 2012 — Point Grey Research Inc. has announced the addition of 2.8-megapixel models to its Grasshopper Express IEEE 1394b (FireWire-b) digital camera series. The Grasshopper Express GX-FW-28S5 camera models are based on color and monochrome versions...
Teledyne FLIR Integrated Imaging Solutions
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Cooled Scientific CMOS Camera
LARNE, Northern Ireland, Jan. 4, 2012 — Raptor Photonics Ltd. has launched a 4.2-megapixel cooled scientific CMOS camera. The Osprey OS4MPc-CL features a 2k × 2k low-noise 2048 × 2048-pixel scientific CMOS sensor that produces high sensitivity, high resolution, high...
Raptor Photonics Ltd.
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AFM Automation Software
Jan 1, 2012 — Asylum Research's MFP-3D and Cypher atomic force microscopes (AFMs) require no programming to perform advanced imaging and measurements. For more advanced, automated and out-of-the-box experiments, the company provides Igor, a user-driven...
Oxford Instruments Asylum Research
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Fiber Lasers
Jan 1, 2012 — NKT Photonics A/S has launched high-power Koheras BoostiK single-mode and single-frequency fiber lasers that offer up to 15-W output with low phase noise and an ultranarrow linewidth for applications in atomic physics, sensing, metrology, and light...
NKT Photonics A/S
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Reference Flats
Jan 1, 2012 — Working with high-stability materials such as glass, Zerodur and silica, Optical Surfaces Ltd. supplies high-precision reference flats that are used to measure the surface accuracy or the transmitted wavefront of flat surfaces or optics. Benefiting...
Optical Surfaces Ltd.
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TERS-Ready AFM System
Jan 1, 2012 — Bruker Corp.'s Nano Surfaces Div. has released the Innova-IRIS, an integrated system for correlated atomic force microscopy (AFM) and Raman spectroscopic imaging. Its ultralow closed-loop noise, no-drift mechanical stability and wide-open optical...
Bruker Nano Surfaces
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i-Raman and PolymerIQ
NEWARK, Del., Dec. 15, 2011 — B&W Tek Inc. and Gnosys Global Ltd. have formed a strategic partnership and introduced PolymerIQ software for accurate, real-time, nondestructive identification and quantification of polymers. Combining B&W Tek’s i-Raman...
B&W Tek LLC
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QI for NanoWizard 3 AFM System
BERLIN, Dec. 9, 2011 — JPK Instruments has announced new quantitative imaging (QI) capabilities for the recently launched NanoWizard 3 atomic force microscopy (AFM) system. The QI mode was developed by the company to facilitate AFM imaging. With QI, a force...
Bruker Nano GmbH, JPK BioAFM
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Reference Flats
KENLEY, England, Dec. 7, 2011 — Working with high-stability materials such as glass, Zerodur and silica, Optical Surfaces Ltd. supplies high-precision reference flats. Reference flats are a proven method of measuring the surface accuracy or the transmitted wavefront of flat...
Optical Surfaces Ltd.
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