Register
Sign In
Subscribe
Advertise
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Register
Sign In
submit press release
AFM News
Real-Time Imaging Reveals Flexibility of Crystal Surfaces
KYOTO, Japan, Dec. 6, 2018 — Images taken using an atomic force microscope have enabled researchers from Kyoto University’s Institute for Integrated Cell-Material Sciences (iCeMS) to observe, for the first time, the flexible and dynamic changes that occur on the surfaces of porous coordination polymer (PCP) crystals when biphenyl guest molecules are introduced. The atomic force microscope was formed using a tiny probe at the end of a cantilever. The probe’s movements over the surface of the material were
Nano-FTIR Spectroscopy Reveals Material’s True Nature
Jan 26, 2018 — Fourier transform infrared spectroscopy (FTIR) from about 2 to 20 µm is a common analytical tool for characterizing material and useful in a range of applications in analytical chemistry, biology, geology and medicine. Besides chemical...
Quantum Effect Between Object and Probe Could Enable Higher Resolution AFM
May 5, 2017 — A novel technique, dubbed quantum atomic force microscopy, has the potential to significantly enhance the spatial, spectral and temporal resolution of AFM for nanometrology of materials. Researchers at Oak Ridge National Laboratory (ORNL) have...
Nanowire Sensors Could Expand Use of AFM
BASEL and LAUSANNE, Switzerland, Oct. 28, 2016 — An atomic force microscope (AFM) that uses nanowires as sensors has demonstrated the ability to measure force size as well as force direction. Due to slight asymmetries in geometry, a nanowire's flexural modes are split into doublets vibrating along...
3D Laser Technology Designs Microscopy Tips at Nanoscale
KARLSRUHE, Germany, Aug. 24, 2016 — Mechanically stable atomic force microscopy (AFM) tips with arbitrary shapes can now be added to existing AFM cantilevers using 3D direct laser writing technology based on two-photon polymerization (TPP). TPP, a 3D printing process that provides...
Laser Cooling Enhances Atomic-Force Microscopy
CANBERRA, Australia, Aug. 19, 2014 — Cooling nanowire probes with lasers could lead to significant improvements in the sensitivity and resolution of atomic-force microscopes. The technique, developed by a team from Australian National University, uses lasers to achieve a broadband...
Nanowire Probes Provide Visual Enhancement for AFM
GAITHERSBURG, Md., May 28, 2014 — Nanowire probe tips originally intended for atomic force microscopes in near-field scanning microwave microscopy (NSMM) applications could have another use.
3-D AFM Could Advance Understanding of Proteins
COLUMBIA, Mo., Jan. 24, 2014 — An advanced 3-D force microscope will allow the study of membrane proteins in conditions similar to those found in the body, an improvement that could lead to increased understanding of proteins on the microscopic level and faster drug therapies.
Ohler to Manage AFM Business for Asylum Research
SANTA BARBARA, Calif., May 29, 2013 — Dr. Ben Ohler has been appointed to the newly created position of atomic force microcopy (AFM) business manager at Asylum Research, an Oxford Instruments company. Ohler will oversee the Asylum MFP-3D family of products as well as manage the...
People In The News
May 1, 2013 — The 2013 Materials Research Society conferred its Outstanding Young Investigator Award to Alexandra Boltasseva, a Purdue University assistant professor, for developing novel materials for advanced plasmonic, metamaterial and transformation optics...
Moshar Joins Asylum Research Sales Team
SANTA BARBARA, Calif., April 1, 2013 — Asylum Research has appointed Amir Moshar to its West Coast technical sales team.
Asylum Research Hires Scientist for AFM Research
SANTA BARBARA, Calif., March 13, 2013 — Asylum Research, an Oxford Instruments Co., hired Florian Johann as an atomic force microscopy (AFM) applications scientist.
AFM-IR IDs Chemicals at Nanometer Scale
URBANA, Ill., March 11, 2013 — Atomic force microscopy (AFM) has been used to measure and characterize materials at the nanometer scale for more than two decades, but a new AFM technique now can measure a material’s chemistry and chemical composition.
Microscopy Tool Adds ‘Color’ with Nanoscale Resolution
BERKELEY, Calif., Dec. 7, 2012 — Nanoscale objects can now be examined in full color, thanks to a new microscopy tip that delivers chemical details with a resolution once thought impossible. The nanotool could help scientists probe solar-to-electric energy conversion at its most...
Semiconductor etching monitored in real time
CHAMPAIGN, Ill. – A nondestructive optical technique that simultaneously etches features onto a semiconductor wafer’s surface while monitoring the entire process in real time with nanometer precision could change the future of semiconductor etching....
Improving Nanoscale Manufacturing with IR Spectroscopy
URBANA, Ill., Oct. 12, 2012 — A new infrared spectroscopy diagnostic tool that can chemically analyze polymer lines as small as 100 nm could be the answer to the industry’s critical need for nanomanufacturing chemical metrology, according to an industry-university collaboration.
Semiconductor Etching Monitored with Light
CHAMPAIGN, Ill., Oct. 1, 2012 — An inexpensive, completely optical technique uses a special type of microscope to simultaneously etch features onto a semiconductor wafer’s surface while monitoring the entire process in real time with nanometer precision.
Asylum Research Names Canadian Distributor
SANTA BARBARA, Calif., July 3, 2012 — Spectra Research Corp. was appointed Asylum’s exclusive Canadian distributor as part of its continued expansion.
Smallest Possible Five-Ringed Structure Created
LONDON, June 7, 2012 — In honor of the upcoming Summer Olympics, the smallest possible five-ringed structure – just 1.2 nm in width and about 100,000 times thinner than a human hair – has been created and imaged using a combination of synthetic chemistry and...
3-D Optical Microscopy Expands Applications
Dec 1, 2011 — High-speed operation has enabled the 3-D optical microscope to transition successfully from a precision laboratory instrument to a rugged, frontline industrial tool for quality control and process-monitoring applications in diverse industries....
AFM Measures Mechanical Properties of Living Cells
WEST LAFAYETTE, Ind., Nov. 22, 2011 — A new atomic force microscope (AFM) technique that measures the mechanical properties of living cells could be used to diagnose human disease and better understand biological processes. Researchers from Purdue University and the University of...
Asylum Research Installs First Cypher AFM in China
SANTA BARBARA, Calif., Aug. 17, 2011 — Asylum Research recently installed the first of its Cypher atomic force microscope systems in China. The system was installed in the lab of Xingsen Gao at South China Normal University’s Institute for Advanced Materials in Guangzhou....
Hot Tip Leads to Nifty Lithography Technique
ATLANTA, July 20, 2011 — Writing circuits and other tiny structures onto flexible plastic substrates could become more practical with a technique developed by researchers at Georgia Institute of Technology. The method could facilitate high-density, low-cost production of...
AFM Forum to Focus on Materials, Life Sciences
ZURICH, Switzerland, June 29, 2011 — Swiss Federal Institute of Technology (ETH Zürich), Atomic Force F&E GmbH and Asylum Research have announced the third Euro AFM Forum. The atomic force microscopy event will be held in Zurich from Sept. 7 to 9 at Science City on ETH...
Asylum Research Announces UK User Meeting and Forum
SANTA BARBARA, Calif., May 23, 2011 — Asylum Research has announced its third UK User Meeting and Forum. Atomic force microscopy (AFM) users are invited to participate in technical talks, tutorials, equipment demonstrations and a poster session. The event is scheduled to be held June...
1
2
3
4
>
(77 results found)
May 2024
Subscribe
Advertise
Issue Library
Latest Products
High-Power Supercontinuum Laser
SuperLight Photonics BV
Twin Table Laser System
eurolaser GmbH
Measurement Vision System
Bowers Group
Smart Camera Solutions
Pekat Vision
MicroLED Sputtering System
Singulus Technologies AG
Radiometric Camera Platform
Teledyne DALSA, Machine Vision OEM Components
Quantum Dot SWIR Sensor
Quantum Solutions
Three-Axis Stages
Optimal Engineering Systems Inc.
Surface-Mount MiniLEDs
Vishay Intertechnology Inc.
Wavefront Phase Camera
Wooptix
Features
Rare-Earth Doped Fibers Deliver Critical Elements to Dynamic Systems
Photonics Spectra
, May 2024
Bottlenecks in Process and Production Hinder Micro-LED Adoption
Photonics Spectra
, May 2024
Beam Deflection Units Increase the Efficiency of Laser Powder Bed Fusion
Photonics Spectra
, May 2024
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.