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JEOL Products
Field Emission Scanning Electron Microscope
PEABODY, Mass., Sept. 18, 2020 — The JSM-IT700HR InTouchScope field emission scanning electronic microscope from JEOL is a compact system that offers ultra-high resolution and versatile analytical capabilities. The JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high- and low-vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded energy dispersive x-ray spectroscopy microanalysis system providing live analysis during...
JEOL USA Inc.
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Atomic Resolution Electron Microscope
TOKYO, April 2, 2020 — The JEM-ARM300F2 GRAND ARM2 atomic resolution electron microscope from JEOL Ltd. is an analytical device that provides high resolution and analysis with a high degree of accuracy. The transmission electron microscope features the FHP2...
JEOL USA Inc.
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MiXcroscopy Correlative Imaging
PEABODY, Mass., March 28, 2014 — The Nikon ECLIPSE LV-N series optical microscope and the JEOL JSM-7000 series field emission scanning electron microscope work concurrently, allowing researchers to observe detailed structures at higher magnifications and to compare them to the...
JEOL USA Inc.
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SEM Upgrade
PEABODY, Mass., July 16, 2012 — Since its introduction in 2008, JEOL USA Inc.’s NeoScope benchtop scanning electron microscope (SEM) has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection and imaging insects for student projects. It...
JEOL USA Inc.
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Analytical Field-Emission SEM
PEABODY, Mass., June 3, 2012 — JEOL USA Inc.’s series of field-emission scanning electron microscopes (SEMs) is now complete with the introduction of the JSM-7800F for nanotechnology imaging and analysis. The microscope makes it possible to observe the finest...
JEOL USA Inc.
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Automated TEM
Oct 1, 2011 — A 200-kV transmission electron microscope (TEM) manufactured by JEOL USA Inc. performs high-throughput nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. The multifunction JEM-2800 features...
JEOL USA Inc.
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Automated TEM for Nanoanalysis
PEABODY, Mass., July 19, 2011 — A 200-kV transmission electron microscope (TEM) manufactured by JEOL USA Inc. performs high-throughput nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. The multifunction JEM-2800 features...
JEOL USA Inc.
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Environmental Control System
PEABODY, Mass., July 14, 2011 — Scientific instrumentation is typically housed in an enclosed room, with just enough access for operation or service. The heat generated from equipment, personnel entering and exiting, and the enclosed facility itself can all affect the performance...
JEOL USA Inc.
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Large-Angle EDS for STEMs
PEABODY, Mass., July 12, 2011 — JEOL USA Inc. has developed an energy-dispersive spectrometer (EDS) for ultrafast, ultrasensitive collection of x-rays through analysis with its scanning transmission electron microscopes (STEMs). The Centurio is a silicon drift detector...
JEOL USA Inc.
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Scanning Electron Microscope
Nov 1, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy-dispersive spectroscopy analysis with the latest silicon drift detector...
JEOL USA Inc.
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Cold FEG
Oct 1, 2010 — A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional and...
JEOL USA Inc.
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InTouchScope SEM
PEABODY, Mass., Sept. 28, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy dispersive spectroscopy analysis with the latest silicon drift detector...
JEOL USA Inc.
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Cold Field Emission Gun
PEABODY, Mass., Aug. 5, 2010 — A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional...
JEOL USA Inc.
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JEM-ARM200F Microscope
PEABODY, Mass., March 12, 2009 – JEOL USA Inc. has introduced the JEM-ARM200F atomic resolution analytical microscope. The 200-kV spherical aberration-corrected scanning/transmission electron microscope (S/TEM) achieves a high angle annular dark-field resolution of 80 pm, or 0.08...
JEOL USA Inc.
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Direct-Write E-Beam System
PEABODY, Mass., July 16, 2007 -- JEOL USA's new high resolution direct-write e-beam lithography system complements its line of spot beam, vector scan systems and mask production tools. The new JBX-5500FS direct-write lithography tool writes patterns at a minimum linewidth of 10...
JEOL USA Inc.
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May 2024
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