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JEOL USA Inc. Products
Scanning Electron Microscope
Nov 1, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy-dispersive spectroscopy analysis with the latest silicon drift detector...
JEOL USA Inc.
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Cold FEG
Oct 1, 2010 — A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope. Now outfitted with the optional and...
JEOL USA Inc.
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ABERRATION-CORRECTED STEM
May 1, 2009 — JEOL USA Inc. has unveiled an atomic resolution scanning transmission electron microscope (STEM). The 200-kV aberration-corrected JEM-ARM200F analytical microscope achieves high-angle annular dark-field resolution of 0.08 nm. It enables atom-by-atom...
JEOL USA Inc.
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IMAGING AND MILLING
Apr 1, 2008 — JEOL USA Inc. has announced the MultiBeam SEM/FIB for focused ion beam micromilling and high-resolution scanning electron microscopy imaging in one unit. The system features the company’s S3 serial slicing and sampling technology, which enables...
JEOL USA Inc.
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MOBILE MICROSCOPE
Feb 1, 2008 — JEOL USA Inc. offers a mobile scanning electron microscope that can be moved to various locations as needed. The CarryScope is suitable for use in a mobile lab for conducting imaging and analysis of trace evidence at a crime scene. In research or...
JEOL USA Inc.
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ANALYTICAL SEM
Jun 1, 2007 — The JSM-7001F is a thermal field emission analytical scanning electron microscope (SEM) that acquires high-resolution micrographs at up to 1,000,000× for low accelerating voltage x-ray spectroscopy and crystallography applications below the 100-nm...
JEOL USA Inc.
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ELECTRON MICROSCOPES
Jun 1, 2006 — The JSM-6390/64-90 series high-resolution tungsten scanning electron microscopes, featuring multiple live image displays, a streamlined graphical user interface and low-kilovolt operation, have been announced by JEOL USA Inc. They enable...
JEOL USA Inc.
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SAMPLE PREPARATION
Sep 1, 2005 — The SM-09010 cross-section polisher from JEOL USA Inc. prepares smooth, thin specimens of materials for examination under scanning electron microscopes. It is suitable for the preparation of samples of layered and composite structures, including...
JEOL USA Inc.
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SCANNING MICROPROBE
Jan 1, 2005 — The JAMP-9500F scanning Auger microprobe for high-resolution surface analysis of microareas from JEOL USA Inc. is suitable for identifying killer defects in interfaces and for analyzing coatings and composites. It achieves minimum probe diameters of...
JEOL USA Inc.
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SAMPLE ANALYSIS
Sep 1, 2003 — By combining the SMI2000MS series focused ion beam (FIB) tool from Seiko and the JEM-2500SE scanning transmission electron microscope from JEOL USA Inc., the two companies have developed a high-throughput technique for preparing cross-sectional...
JEOL USA Inc.
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(10 results found)
May 2024
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