Register
Sign In
Subscribe
Advertise
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Publications
Photonics Spectra
BioPhotonics
Vision Spectra
Photonics Showcase
Photonics Buyers' Guide
Photonics Handbook
Photonics Dictionary
Newsletters
Bookstore
News & Features
Latest News
Latest Products
Features
All Things Photonics Podcast
By Technology
Lasers & Light Sources
Optics
Materials & Coatings
Imaging
Sensors & Detectors
Test & Measurement
Integrated Photonics
Spectroscopy
Biophotonics
Machine Vision
Marketplace
Supplier Search
Product Search
Career Center
Webinars & Events
Webinars
Photonics Media Virtual Events
Industry Events Calendar
Resources
White Papers
Videos
Contribute an Article
Suggest a Webinar
Submit a Press Release
Subscribe
Advertise
Become a Member
Register
Sign In
submit product
Rudolph Technologies Inc. Products
Thin-Film Metrology System
FLANDERS, N.J., May 13, 2013 — Rudolph Technologies Inc. has released the S3000SX thin-film metrology system for transparent films in semiconductor fabrication applications at the 28-nm node and below. The 405-nm system, which can be tailored to specific process...
Rudolph Technologies Inc.
Request info >
Metrology System
Oct 1, 2009 — Rudolph Technologies Inc. has unveiled the S3000S metrology system for in-line process control of advanced diffusion and fab-wide thin-film applications. The system enables simultaneous measurement with multiwavelength, multiangle focus beam...
Rudolph Technologies Inc.
Request info >
SOFTWARE TOOL
Apr 1, 2009 — To help photovoltaic manufacturers increase cell efficiency and reduce costs, Rudolph Technologies Inc. has introduced a fab management software tool. Discover Solar data management and analysis software enables process engineers to monitor the...
Rudolph Technologies Inc.
Request info >
METROLOGY SYSTEMS
Aug 1, 2006 — Metrology systems for measuring thin transparent films have been introduced by Rudolph Technologies Inc. The S3000 (300 mm) and S2000 (200 mm) use proprietary fifth-generation Focus beam ellipsometry technology that incorporates long-life laser...
Rudolph Technologies Inc.
Request info >
MACRODEFECT INSPECTION
Nov 1, 2004 — The WaferView 325 system from Rudolph Technologies Inc. provides high-throughput, automated detection and classification of macro and submicron defects on the front, back and edge of 300-mm wafers. It incorporates two inspection heads that operate...
Rudolph Technologies Inc.
Request info >
METROLOGY SOFTWARE
Feb 1, 2004 — Expert application system (Easy) software released by Rudolph Technologies Inc. enhances the capabilities of the company's MetaPulse and MetaPulse-II opaque film metrology line to cover 90-nm chip manufacturing processes. The software is suitable...
Rudolph Technologies Inc.
Request info >
(6 results found)
May 2024
Subscribe
Advertise
Issue Library
Latest News
Your garden is absolutely glowing, darling
May 5, 2024
Gallatin College, Montana State University
May 3, 2024
Rare-Earth Doped Fibers Deliver Critical Elements to Dynamic Systems
May 3, 2024
A roadblock on the roadmap
May 3, 2024
Bottlenecks in Process and Production Hinder Micro-LED Adoption
May 3, 2024
LED Applications Require Exposure Limits to Safeguard Consumers
May 3, 2024
Beam Deflection Units Increase the Efficiency of Laser Powder Bed Fusion
May 3, 2024
Fine and Fast Metal Printing Meets Industrial Challenges in 3D
May 3, 2024
The Winds of Change Are Blowing Through the Photonics Industry
May 3, 2024
PsiQuantum to Build Utility-Scale Quantum Computer in Australia
May 3, 2024
Features
Rare-Earth Doped Fibers Deliver Critical Elements to Dynamic Systems
Photonics Spectra
, May 2024
Bottlenecks in Process and Production Hinder Micro-LED Adoption
Photonics Spectra
, May 2024
Beam Deflection Units Increase the Efficiency of Laser Powder Bed Fusion
Photonics Spectra
, May 2024
Explore Our Content
News
Features
Latest Products
Webinars
White Papers
All Things Photonics Podcast
Videos
Our Summits & Conferences
Industry Events
Bookstore
Join Our Community
Subscribe
Advertise
Become a member
Sign in
Contribute a Feature
Suggest a Webinar
Submit a Press Release
Mobile Apps
About Us
Our Company
Our Publications
Contact Us
Career Opportunities
Teddi C. Laurin Scholarship
Terms & Conditions
Privacy Policy
California Consumer Privacy Act (CCPA)
©2024 Photonics Media
100 West St.
Pittsfield, MA, 01201 USA
[email protected]
We use cookies to improve user experience and analyze our website traffic as stated in our
Privacy Policy
. By using this website, you agree to the use of
cookies
unless you have disabled them.