Optical Profiler
TERRASSA, Spain, July 15, 2019 — The S neox optical profiler from Sensofar Metrology is a high-performance, noncontact 3D microscope system designed for subnano, nano, and micro-scale measurement, with advanced inspection and analysis capabilities.
With smart algorithms, data acquisition is taken at 180 fps, measures the shape of large rough surfaces, and has been improved to provide a more reliable focus location, even on optically smooth surfaces. A thin-film measurement technique allows the user to quickly,...
Sensofar Metrology