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Microspectrophotometer
Oct 1, 2011 — For the semiconductor industry, Craic Technologies Inc. has developed the 20/20 XL, a film thickness measurement tool. The microspectrophotometer nondestructively analyzes and images microscopic areas of very large samples. Thin-film thickness can be measured in both transmission and reflectance. The system measures the Raman spectra of microscopic samples and performs ultraviolet and near-infrared microscopy of semiconductor and other types of samples. Applications include mapping thin-film...
CRAIC Technologies
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Film Thickness Measurement Tool
SAN DIMAS, Calif., July 11, 2011 — For the semiconductor industry, Craic Technologies Inc. has developed the 20/20 XL, a film thickness measurement tool. It is a microspectrophotometer designed to nondestructively spectrally analyze and image microscopic areas of very large samples....
CRAIC Technologies
Request info >
Laser Controller
Jan 4, 2010 — Toptica Photonics’ DigiLock 110 is a digital module for laser control and frequency stabilization. It also can be used to control and analyze the laser digitally. Functions include side- and top-of-fringe locking, and signal visualization and...
TOPTICA Photonics Inc.
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May 2024
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