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atomic force microscopy White Papers
Resonant Probe AFM: Uses and Advantages
A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and surface morphology. This article discusses resonant...
Principles of Scanning Nitrogen-Vacancy Magnetometry Explained
Scanning nitrogen-vacancy (NV) magnetometry is a measurement technique that combines scanned probe microscopy (SPM) with optically detected magnetic resonance (ODMR) to image magnetic field distribution with high spatial resolution (<50 nm). This...
Positioning at the Nanoscale (and Below): Trust in Proven Performance
Through a deep knowledge of sensing technologies, technically adept personnel, and experience across applications as diverse as astronomy to live cell imaging, Mad City Labs helps our customers develop cost-effective and high-performance solutions....
High-Resolution Chemical Imaging with Tapping AFM-IR
Where the spatial resolution of conventional bulk IR spectroscopy is limited by diffraction to ~3-10 µm, atomic force microscopy (AFM) provides a nanoscale topographic map of a sample surface. However, AFM has been unable traditionally to chemically...
(4 results found)
April 2024
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