X-rays Exceed 'Critical Angle'
UPTON, N.Y., Oct. 1, 2007 -- A new method uses refractive lenses to focus x-rays down to extremely small spots, a breakthrough important in the development of a new light-source facility that promises advances in nanoscience, energy, biology and materials research.
At Brookhaven National Laboratory’s National Synchrotron Light Source (NSLS), a team of scientists has exceeded a limit on the ability to focus “hard,” or high-energy, x-rays known as the “critical angle.”
Members of the research team at Brookhaven National...