FEI Co. and Malvern Instruments Team for Nanoparticle Analysis
Sep 12, 2006 — FEI Co. of Hillsboro, Ore., and Malvern Instruments Ltd. of Malvern, England, have signed a joint development and marketing program for advanced nanoparticle analysis using Malvern's particle image analysis software on FEI's line of Quanta scanning electron microscopes (SEMs), the companies announced today. It is the first time Malvern software has been applied to another company's instruments, Malvern officials said. The software is currently in use with traditional optical microscopes, and...