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scanning probe microscope Products
AFM/NSOM Instrumentation
Jan 1, 2011 — Mad City Labs Inc.’s MadPLL is a fully integrated instrument package that allows the user to create an inexpensive, high-resolution resonant scanning probe microscope using the company’s nanopositioning systems. It can create an instant closed-loop atomic force microscope (AFM)/near-field scanning optical microscope NSOM at a fraction of the cost of commercial systems. It is designed for tuning forks and Akiyama probes and is fully compatible with Mad City Labs’...
Mad City Labs Inc.
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Control Station
Nov 1, 2010 — JPK Instruments AG has Introduced the Vortis Advanced, a fully digital scanning probe microscope (SPM) electronics control system with low noise and high signal speed. It is available with all of the company’s SPM systems, enabling the...
Bruker Nano GmbH, JPK BioAFM
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Scanning Probe Microscope
Feb 28, 2010 — The MultiMode 8 scanning probe microscope launched by Veeco Instruments Inc. employs two proprietary and patent-pending technologies, ScanAsyst and PeakForce QNM. The former has an automated imaging optimization mode that provides access to advanced...
Veeco Instruments Inc.
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AFM
Jan 1, 2009 — The Cypher atomic force microscope (AFM) has been released by Asylum Research Corp. The small-sample AFM/SPM (scanning probe microscope) provides closed-loop atomic resolution using sensors in all three axes. Other features include SpotOn automated...
Oxford Instruments Asylum Research
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MICROSCOPE
Sep 1, 2007 — The Innova scanning probe microscope has been released by Veeco Instruments Inc. for use in physical, materials and life sciences applications. It performs low-noise closed-loop scanning and offers easy tip exchange, better than 1-μm-resolution...
Veeco Instruments Inc.
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MICROSCOPE CONTROL
Aug 1, 2006 — The NanoScope V extends Veeco Instruments Inc.’s range of scanning probe microscope (SPM) systems. The device achieves reliable high-speed data acquisition of high-density images of 5120 × 5120 pixels. Eight images can be simultaneously captured and...
Veeco Instruments Inc.
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SCANNING MICROSCOPE
Jun 1, 2004 — Nanonics Imaging Ltd. has released the MultiView 400, a modular scanning probe microscope with a free optical axis from above and below the sample. The device can be moved easily among standard upright and inverted optical host microscopes. It can...
Nanonics Imaging Ltd.
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May 2024
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