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MORE LIGHT SOURCESLIGHT SOURCES HANDBOOK ARTICLES
Scatter and BSDF Measurements: Theory and Practice Feb 7, 2018 — Understanding the fundamental characteristics of scatter and the limitations imposed by scatterometers is essential to performing meaningful stray light calculations.
Tunable Light Sources: A Popular Choice for Measurement Applications Feb 10, 2016 — Many common spectroscopic measurements require the coordinated operation of a detection instrument and light source, as well as data acquisition and processing. Integration of individual components can be challenging and various applications may...
Microscopy Illumination: Considering Nonlaser Light Sources Jan 19, 2016 — As recently as five years ago, shopping for a microscope light source was fairly straightforward. For routine applications, it was tungsten halogen, typically 100 W, while for fluorescence, it was an arc source, typically 100 W mercury. Today, there...
Aspheric Lenses: Design Considerations Apr 27, 2015 — This first of two articles will cover design and manufacturing options for aspheres; the second will include more detail on manufacturing and testing processes. These articles will provide the tools optics designers need to tailor their designs to...
Integrating Spheres: Collecting and Uniformly Distributing Light Jan 1, 2015 — The integrating sphere is a simple, yet often misunderstood, device for measuring optical radiation. An integrating sphere’s function is to spatially integrate radiant flux (light). However, before one can optimize a sphere design for a...
Interferometry: Measuring with Light Jan 1, 2015 — Long applied to optical shop testing, interferometry is now used to measure many different types of parts in a variety of applications, such as optical system performance, surface roughness, surface form, and displacement of moving surfaces. An...
Light-Emitting Diodes: A Primer Jan 1, 2015 — The wavelength range of commercially available LEDs with single-element output power of at least 5 mW is 360 to 950 nm. Each wavelength range is made from a specific semiconductor material family, regardless of the manufacturer. This article will...
Optical Delay Lines: Key to Time-Resolved Measurements Dec 8, 2014 — To obtain an accurate means of creating reliable delays in any time-resolved spectroscopy or dynamic experiment, several factors about the delay line stage must be considered to reduce or eliminate errors associated with linear stages. One of the...
Standard CIE Illuminants Mar 8, 2009 — For purposes of standardized discussion of colorimetry, the Commission International de L'Eclairage (International Commission on Illumination), CIE established three standard sources of illumination: the tungsten lamp, noon sunlight and average...
Colorimetry: How to Measure Color Differences Apr 13, 2006 — Colorimetry, the science of color measurement, is widely employed in commerce, industry, and the laboratory to express color in numerical terms and to measure color differences between specimens. Applications include paints, inks, plastics, textiles...
Machine Vision Lighting: A First-Order Consideration Apr 13, 2006 — Lighting, sometimes a step-child in machine vision considerations, has become a first-order consideration in automated applications. In the beginning, automated inspection focused on the camera and optics, the algorithms, the interface hardware and...
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