Semiconductor Failure Analysis
HILLSBORO, Ore., Nov. 21, 2012 — For semiconductor failure analysis, FEI has released its Helios NanoLab 450 F1 DualBeam, a system that provides manufacturers with faster, better images of their device architectures. A scanning transmission electron microscope (STEM) detector delivers improved contrast between materials, and the new flip stage and rotating nanomanipulator support advanced preparation techniques for complex device architectures, such as finFETs and 3-D memory structures.
Dual-beam instruments combine a...
FEI Life Sciences (acquired by Thermo Fisher)