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atomic force microscopy Features
LSCM and RelA for Quantifying Microwear: A Case Study
Laser scanning confocal microscopy and relative area are effective tools for surface-roughness analysis of experimental Mistassini quartzite scrapers. Laser scanning confocal microscopy (LSCM) and relative area (RelA) are effective tools for the...
Photonics Spectra, February 2015
Nanoscale Biomaterials Require Close Observation
Replacement bones and blood vessels are just two types of artificial tissues that require deep-imaging microscopy techniques to develop. Studying useful materials is not limited to macroscale structures such as sheet metal, optical glass, wood...
Photonics Spectra, July 2012
Unprecedented Spatially Resolved Chemical Analysis Via Nanoscale Spectroscopy
The phrase “lab on a tip,” referring to nanoscale property measurements made by the probe of an atomic force microscope (AFM), has been a dream for the developers of analytical instrumentation. There also has been a drive for...
Photonics Spectra, December 2010
Reflecting on the Past
One source rarely considered when addressing photonics issues is our ancestors: Great technological discoveries from many millennia ago may lead to modern day solutions. A recent example of this involves optimizing gold-based infrared reflectors...
Photonics Spectra, September 2009
Nanoscale Light Sources Could Benefit Near-Field Scanning Optical Microscopy
The probe tip traditionally used with near-field scanning optical microscopes comprises an optically pumped device that transmits light from a far-field source to the sample through either a hollow pyramid or an optical fiber, possibly leading to...
Photonics Spectra, January 2008
Micromembrane Probe Improves Atomic Force Microscopy
A significant advance in atomic force microscopy (AFM) is at hand, thanks to a new type of probe that enables the acquisition of data on dynamic molecular interactions and the simultaneous collection of information about various material and surface...
Photonics Spectra, April 2006
Photoswitchable Molecular Tip Designed for AFM Chemical Identification
Chemists at Tokyo Institute of Technology and at the University of California, Santa Barbara, have designed and synthesized a photoswitchable molecule that they suggest could be used in conjunction with atomic force microscopy (AFM) to identify...
Photonics Spectra, March 2006
For Atomic Force Microscopy, the Beat Goes On
Researchers have found dynamic force microscopy, or atomic force microscopy (AFM), useful for tracing surfaces on an atomic scale. The technique even may be capable of following biological samples in real time as they twist and turn. The difficulty...
Photonics Spectra, February 2005
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