DEXTER, Mich., March 28, 2023 — The kSA XRF (X-ray fluorescence) tool from k-Space measures film thicknesses below 100 nanometers for applications in coated glass and solar panels. The system uses an X-ray source, detector, and proprietary software to measure the X-ray emission...

DUNEDIN, Fla., Aug. 30, 2012 — Ocean Optics’ NanoCalc systems use spectroscopic reflectometry to determine optical thin-film thicknesses for consumer, semiconductor, medical and industrial applications. Customer-designed and application-ready preconfigured NanoCalc models...

Sep 1, 2010 — Baumer has introduced the OADM 250, an optical laser distance sensor designed to accurately detect target objects, regardless of surface properties or color, at distances from 0.2 to 4 m away. Based on time-of-flight technology, the compact sensor...

SOUTHINGTON, Conn., July 8, 2010 — Baumer has introduced the OADM 250, an optical laser distance sensor designed to accurately detect target objects, regardless of surface properties or color, at distances from 0.2 to 4 m away. Based on time-of-flight technology, the compact sensor...

Nov 1, 2008 — SolaryX, an edge laser processing system, has been released by Newport Corp. for thin-film solar cell manufacturing. It performs edge deletion and removal of thin-film coatings on solar panels and, the company says, offers a lower cost of ownership...

SAN JOSE, Calif., July 31, 2007 -- Avago Technologies, a supplier of analog interface components for communications, industrial and consumer applications said its APDS-9007 ambient-light sensor has a precise, logarithmic output response over a wide variety of lighting conditions. ...