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Laser-Induced Damage Threshold Values and How They Impact You

Oct 25, 2017
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ABOUT THIS WEBINAR
With a more thorough understanding of Laser-Induced Damage Threshold (LIDT) specifications, your business can avoid unnecessary manufacturing costs. This webinar will cover ISO LIDT specifications and how they can affect optics manufacturing. It will provide you with a better understanding of LIDT testing and more comprehensive knowledge of laser optics manufacturing.

Behind the single number that is reported from LIDT testing according to ISO 21254-1 lies a complex landscape of parameters and testing conditions. LIDT testing can be performed to this standard in a method that allows significant leeway for optical component producers to specify components in a fashion that does not correspond to real-world applications.

This webinar will provide you with an understanding of what a specified LIDT value means and how it affects your application. In addition, it will explain the difference between achieving a single LIDT test value in small quantities and consistently meeting a specified LIDT in production. This difference, combined with choosing test parameters that are not relevant for real-world applications, can result in the frequent over-specification of damage threshold values that can lead to higher costs.

Who should attend: Optical engineers, design engineers, solutions engineers, application engineers

Nathan Carlie, Ph.D., R&D Manager, Edmund OpticsAbout the presenter: 
Nathan Carlie received his Ph.D. in materials science and engineering from Clemson University in 2010 and has spent the last seven years developing materials and technologies for high-power lasers and IR optics. He joined the Edmund Optics team in 2016 and serves as R&D manager at the corporate headquarters in Barrington, N.J. Carlie holds six patents and has written over 40 papers and articles on the design and fabrication of optical materials and systems.

Research & TechnologyBusinessAmericasopticslasersTest & Measurementlaser-induced damage threshold
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