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Thu, Nov 2, 2023 10:00A EDTLock-in Amplifier or Boxcar Averager? Choosing the Right Measurement Tool for Periodic Signals
Gustavo Ciardi (Zurich Instruments)

When it comes to analyzing periodic signals, selecting the appropriate measurement tool is crucial for achieving accurate and meaningful results. Gustavo Ciardi of Zurich Instruments delves into the theory behind two powerful techniques, lock-in amplification and boxcar averaging, to help...


Revolutionizing Measurements: Next-Generation Strategies for Modern Phase DetectionDaniel Shaddock (Liquid Instruments)Jun 20, 2023

Medical Laser Applications: Defining Measurement Solutions That Keep the Process on TrackMark Slutzki (Ophir Optronics Solutions Ltd.MKS Instruments, Inc.)May 17, 2023

As Applications Multiply, Silicon Photonics Manufacturing Needs to SubtractScott Jordan (Pl (Physik Instrumente) L.P.)May 2, 2023

QCL Dual-comb Spectroscopy for Density and Melt Flow Rate Prediction of PolyethyleneMarkus Geiser (IRsweep AG)Apr 19, 2023

Key Considerations When Utilizing Laser-Induced Breakdown SpectroscopyJohn Gilmore (Hamamatsu Corporation)Apr 19, 2023

3D Optical Metrology: Capabilities for a New EraKevin Harding (Optical Metrology Solutions)Jan 19, 2023

Key Considerations for Part and Sample Holding in Interferometric CharacterizationFrank DeWitt (XONOX Technology Inc.)Jan 18, 2023

Precision Automation Principles for the Optimal Testing and Packaging of PIC DevicesBrett Heintz (Aerotech Inc.)Jan 12, 2023

Laser Measurement Accuracy: Why, When, and HowMark Slutzki (Ophir Optronics Solutions Ltd.MKS Instruments, Inc.)Jan 11, 2023

How PIC Testing Is Evolving to Meet Rapidly Advancing ApplicationsIñigo Artundo (VLC Photonics)Jan 11, 2023

How to Boost Your Objective Lens Assembly with State-of-the-Art Alignment TechnologyChristian Buss (TRIOPTICS GmbH), Patrik Langehanenberg (Trioptics GmbH)Jan 11, 2023

Benefits and Limitations of Hand-Held Digital Light Processing SpectrophotometersRez Mani (Allied Scientific Pro)Jan 11, 2023

Minimizing Interferometric Measurement Variations During Optical ManufacturingRobert Smythe (Äpre Instruments)Jan 11, 2023

The Technology-Enabling Power of Dynamic InterferometryErik Novak (4D Technology Corp, an Onto Innovation business)Jan 11, 2023

Metrology for Polarization OpticsTom Baur (Meadowlark Optics)Jan 11, 2023

Rethinking Scratch-and-Dig SpecificationsDave Aikens (Savvy Optics)Jan 11, 2023

Developments in Optical Coating Metrology TechnologyJared Sittig (Optimax)Jan 11, 2023

Optimizing Micromachining Processes via Pulse-to-Pulse Measurement of Ultrafast LasersSergio Pellegrino (LaserPoint)Jan 11, 2023

Beginning Steps and Best Practices for Measuring Laser Beam ParametersAhmed Rihane (Gentec-EO)Jan 11, 2023

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