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Ellipsometry: What Is It and What Can It Do for You?

May 13, 2020
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ABOUT THIS WEBINAR
Spectroscopic ellipsometry is a nondestructive technique that uses polarized light to probe a sample. In this webinar, presenter Andrew Martin of J.A. Woollam will cover the science behind ellipsometry and the types of information you can extract from the data. You will learn:
  • The fundamental principles of ellipsometry that lead to highly accurate measurements of coating thickness and optical properties.
  • How ellipsometry measurements compare to other characterization techniques.
  • An overview of common applications including high/low stacks, ALD deposition monitoring, temperature-based studies, and more.

Light interacting with a material changes the polarization state and provides sensitivity to film thickness and optical properties. Courtesy of J.A. Woollam Co.</center><</center>><r>


Light interacting with a material changes the polarization state and provides sensitivity to film thickness and optical properties. Courtesy of the J.A. Woollam Co. 

About the presenter:
Andrew Martin, Applications Engineer, J.A. Woollam.Andrew Martin joined J.A. Woollam as an applications engineer after completing his master’s degree in electrical engineering in 2009. As an applications engineer, Martin provides support to customers through multiple communication media, including email, phone, and on-site short courses.




Who should attend:

Engineers and researchers who:

  • Design or manufacture optical coatings.
  • Deposit films using ALD, CVD, sputtering, or other coating techniques.
  • Research optical properties or dielectric response of materials.
  • Monitor thin-film thickness or refractive index in quality control environments.
About the J.A. Woollam Co.
The J.A. Woollam Co. was founded in 1987 by Dr. John A. Woollam. It started as a spinoff from the University of Nebraska and has rapidly grown to become a worldwide leader in spectroscopic ellipsometry. The company’s commitment to innovation continues to drive revolutionary breakthroughs in ellipsometry technology and has produced more than 200 patents. J.A. Woollam now offers a lineup of tools with spectral ranges varying from the terahertz to vacuum ultraviolet. 
Research & TechnologyeducationWebinarsAmericasThe J.A. Woollam CompanyellipsometryspectrometryspectroscopyTest & Measurementopticslight sourceslight polarizationMicroscopyaerospaceagricultureastronomyautomotiveBiophotonicsCommunicationsdefenseenergyenvironmentindustrialmedicalmedicinenanoophthalmologysemiconductorssolarcoatingsmaterialsoptical materialsJ.A. Woolham Co.
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