Search
Menu
Zurich Instruments AG - Boost Your Optics 1-24 LB

Reducing Production Waste with Laser Profiling and Characterization

Facebook X LinkedIn Email
Author: Mark Szorik
Monday, May 1, 2017
MKS Ophir, Light & Measurement

A laser profiling system can characterize and identify which variables affect product quality and waste. But many laser users have never evaluated the quality of the beam beyond the initial delivery. This leads to frequent process adjustments to try to get back to "normal" and frantic calls to outside laser services. Wouldn't it be better to avoid these problems and added expenses?

Download White Paper
File: Ophir_Beam_Profiling_ms.pdf (266.42 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with MKS Ophir, Light & Measurement and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
LasersTest & MeasurementindustrialOphirlaser beam profilingbeam characterizationLaser Beamlaser manufacturingbeam diameterwaste reductionscanning slit profilercamera based profilinghigh power lasersfocus spot sizebeam positionbeam waist
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.