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Introducing a Novel Spectral Analysis System for Measuring High-Performance Thin-Film Optical Filters

Author: Alannah Johansen, Amber Czajkowski, Niels Cooper, Mike Scobey, Peter Egerton, and Rance Fortenberry, PhD
Saturday, July 01, 2017
The HELIX Spectral Analysis System was designed to address the limitations of most commercially available spectrophotometers when measuring high-performance thin-film optical filters. The system’s capabilities are four-fold: it is able to track filter edges to OD7 (-70 dB), evaluate blocking to OD9 (-90 dB), resolve edges as steep as 0.4% relative to edge wavelength from 90% transmission to OD7, and resolve passbands that are as narrow as 0.1 nm at full width half maximum (FWHM).
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File: Alluxa_HELIX_Spectral_Analysis_System.pdf (1.62 MB)
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