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Atomic Force Microscopy Enhances the Nanoscopy Toolkit

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Author: James F. MacKay
Friday, March 5, 2021
Mad City Labs Inc.

Imaging and morphology represent a critical puzzle piece when trying to understand nanoscale structures, whether they are naturally occurring, such as viruses, or engineered structures, such as nano-antennas and photonic devices. In addition to imaging, atomic force microscopy (AFM) is ideal for nanomechanical characterization, bringing utility to nanoscopy applications and excelling in conditions where low light presents challenges or sample integrity is vital.

File: AFM_enhances_the_nanoscopy_tookit.pdf (1.60 MB)
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microscopes & accessoriespositioning/vibration-isolation equipmenttest & measurement equipmentmaterials researchMicroscopyAFMSPMatomic force microscopescanning probeoptical microscopymetrologycorrelative microscopy
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