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Fractional Pixel Method for Improved Pixel-Level Measurement and Correction (Demura) of High-Resolution Displays

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Wednesday, October 7, 2020
Radiant Vision Systems, Test & Measurement

As display resolutions increase, imaging systems are challenged to continue to provide accurate pixel-level measurements while applying increasingly limited relative imaging resolution during single-image analysis (necessary for production efficiency). A fractional pixel registration and measurement method improves the accuracy of pixel-level values measured by standard-resolution systems, ensuring effective qualification and demura of high-resolution OLED, miniLED, and microLED displays.

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imagingmachine visionTest & MeasurementdisplaypixelmicroLEDminiledOLEDpixel measurementpixel correctiondemuraluminanceAOIAVIinspection
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