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Industrial Equipment Failure Analysis Using FT-IR Microscopic Techniques

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Wednesday, May 12, 2021
PerkinElmer

This work demonstrates that FT-IR microscopy analysis is capable of determining the cause of failures of many different pieces of industrial equipment. This analysis can then allow the user to take preventative action measures in order to improve the reliability of the system and minimize future failures.

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File: Industrial_Equipment_Failure_AnalysisApp_Note.pdf (2.57 MB)
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microscopes & accessoriesmaterials researchMicroscopyspectroscopyindustrial equipmentfailure analysisFT-IR
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