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Laser-Based Sample Preparation for Microstructure Diagnostics

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Wednesday, October 2, 2019
3D-Micromac AG

There is an increased demand for preparation techniques tuned to manifold methods of microstructure diagnostics that need to be fast, reliable, cost effective, artifact-free, and targeted. Traditional mechanical preparation and focused-ion-beam micromachining currently dominate the field. Laser-based sample preparation represents a very valuable alternative approach and make new sample geometries possible. This whitepaper shows the advantages of this technology and how it can be used to prepare TEM lamellas.

File: microPREP_Overview_20191002_final.pdf (258.56 KB)
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3D-Micromac AGMicroscopysample preparationspecimen preparationTEM lamellasultrashort pulsed laserslaser ablationmicrostructure diagnosticsTEM specimensTEM samples
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