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Measuring and Correcting MicroLED Display Uniformity

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Author: Radiant Vision Systems
Monday, February 1, 2021
Radiant Vision Systems, Test & Measurement

As individual emissive elements, microLEDs commonly exhibit luminance and color variations at the pixel level. These variations require each microLED to be measured and adjusted individually to ensure visual uniformity across the display. Thus, a measurement and correction system for microLED manufacture must be capable of precise quantification of the output of each emissive element (the individual LED or subpixel), with very low takt times to correct the high quantity of emitters in a single display and to support low-waste, high-volume production processes. This paper presents equipment specifications, imaging techniques, and software algorithms that increase the accuracy of subpixel measurement for luminance and chromaticity to enable microLED correction (demura) and quality control.

File: Measuring_and_Correcting_MicroLED_Display.pdf (3.34 MB)
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industrialmachine visionMicroscopymicroLEDcolorimeterluminancechromaticitydisplayuniformitycorrectioncalibrationdemurapixelsubpixelpixel uniformity correctiondisplay testdisplay measurementdisplay correctionmicrodisplayLEDadjustmentgammagray levelgraylevelinspectioninspection systemimagingImaging SystemtristimulusCIEresolution
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