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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers
view all white papers and application notes

Near-Field Scanning Optical Microscopes: Capabilities and Applications

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Author: James F. MacKay and Beau Brossman
Wednesday, March 10, 2021
Mad City Labs Inc.

NSOM techniques and instrumentation have evolved to become vital tools for material characterization, providing high-quality data and continually expanding utility, spot-on accuracy, adaptability, and exceptionally high definition. This article examines apertured and apertureless NSOM equipment and techniques: how they are achieved, what information they can provide, and applications in which they excel.
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