Search
Menu
Meadowlark Optics - SEE WHAT

Polarization Metrology of Anisotropic Materials

Facebook X LinkedIn Email
Author: Dr. John Freundenthal
Monday, July 3, 2023
Hinds Instruments Inc.

Full Mueller matrix measurements allow for elimination of ambiguity and a fuller understanding of polarization metrology. The Exicor® 150XT system offers complete Mueller matrix measurement from 350 nm to 800 nm with automated sample translation and optional tip-tilt measurements. Integration times as low as 0.01 seconds for measurements of the Mueller matrix to 0.001. Partial Mueller matrix systems can attain measurements of 8 Mueller parameters with precision of 0.0001.

Download White Paper
File: Polarization_Metrology_of_Anisotropic_Materials.pdf (1.92 MB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:




When you click "Download", you agree that your personal contact information may be shared with Hinds Instruments Inc. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
Materials & Chemicalsnanophotonicsspectroscopypolarization metrologyellipsometerytransmission polarimetrycircular dichroismlinear optical propertiesMueller polarimetrymaterial internal strain analysispolarimetric propertiesdepolarizationquantization of depolarizationTest & Measurement
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.