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Real-time Profiling for Focusing, M2, Divergence & Alignment

Author: Andrew MacGregor, Ph.D., VP Operations & Support and Rocco Dragone, M.Sc.Eng., VP Engineering
Monday, January 14, 2013
DataRay Inc.

Beam intensity profiling is an essential tool in many aspects of photonics. The precise intensity distribution in a focused laser beam is critical in many applications: flow cytometry, laser printing, medical lasers, and cutting lasers are just a few examples. Intensity profile measurements can characterize and improve a product or process, leading to substantial cost and time savings that can pay for the measurement instrument many times over. This white paper describes how the unique, patented, real-time multiple z-plane XYZTF capabilities of the BeamMap2 slit-scan profiler can speed and simplify laser assembly alignment.

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File: Photonics_Spectra_DataRay_BM2_whitepaper_final.pdf (1.41 MB)
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Real-time Profiling for Focusing, M2, Divergence & Alignment