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Reducing Production Waste with Laser Profiling and Characterization

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Author: Mark Szorik
Monday, May 1, 2017
Ophir, Photonics

A laser profiling system can characterize and identify which variables affect product quality and waste. But many laser users have never evaluated the quality of the beam beyond the initial delivery. This leads to frequent process adjustments to try to get back to "normal" and frantic calls to outside laser services. Wouldn't it be better to avoid these problems and added expenses?

File: Ophir_Beam_Profiling_ms.pdf (266.42 KB)
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