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Applied Scientific Instrumentation - Microscope Stages LB 9/22

Resonant probe AFM: Uses and Advantages

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Author: James F. MacKay
Tuesday, May 18, 2021
Mad City Labs Inc.

A resonant probe atomic force microscope (AFM) offers capabilities and benefits not found in commonly used optical deflection AFMs in the measurement of physical constants, physical properties, and surface morphology. This article discusses resonant probe AFM construction, functionality. Some of the applications particularly well suited to resonant probe AFM are optical antenna properties, quantum materials (NV center research), and terahertz microscopy/spectroscopy.

File: V2_12693_1_Resonant_probe_AFM_0420_corrected_.pdf (279.01 KB)
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Microscopymicroscopes & accessoriesnanophotonicspositioning/vibration-isolation equipmentoptical computingdata storageAFMatomic force microscopeNSOMnear-field optical microscopyNV centerstuning forksterahertz microscopyoptical antennaQuantum Materialsnitrogen vacancymetrologymaterials research
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