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Simultaneous Intensity Profiling of Multiple Laser Beams Using the BladeCam-XHR Camera

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Author: Shaun Pacheco and Rongguang Liang, College of Optical Sciences, University of Arizona; Rocco Dragone, Vice President of Engineering, DataRay, Inc.
Friday, September 26, 2014
DataRay Inc.

There are several applications where the parallel processing of multiple beams can significantly decrease the overall time needed for the process. Intensity profile measurements that can characterize each of those beams can lead to improvements in that application. If each beam had to be characterized individually, the process would be very time consuming, especially for large numbers of beams. This white paper describes how the BladeCam-XHR can be used to simultaneously measure the intensity profile measurements for multiple beams by measuring the diffraction pattern from a diffraction grating and the intensity profile from a 3x3 fiber array focused using a 0.5 NA objective.

File: DataRay_XHR_whitepaper.pdf (972.96 KB)
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DataRay Inc.real-time profilingBladeCam-XHRdiffraction gratingsbeamsplitting phase gratinglaser beam analysismultiple beamsmeasure multiple beamsexcitation beamsbeam profiler sensor
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