USI Universal Adaptive Profiling Measurement Mode for Superior Surface Texture Characterization

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Author: Stephen Hopkins
Tuesday, December 1, 2020
Bruker Nano Surfaces

Bruker has recently released the Universal Scanning Interferometry (USI) measurement mode to enable universal measurement results on wide-ranging surfaces for ContourX white light interferometry (WLI) profilometers. USI provides fully automated, self-sensing surface texture optimized signal processing while delivering the most accurate and realistic computation of the surface topography being analyzed.

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File: Universal_Adaptive_Profiling_Measurement_Mode.pdf (3.68 MB)
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