Wideband Optical Modulator and Detector Characterization: Uncertainties and the Impact on Eye Diagrams/Time Domain Modeling

Facebook X LinkedIn Email
Wednesday, April 11, 2018
Anritsu Co.

Optical modulators and detectors operating to 110 GHz or higher have existed for years and characterization/calibration methods have been well-published, but less attention has been paid to the optimization of uncertainties of those converter measurements in a practical user context. This paper will explore the characterization and calibration processes, mainly for >70 GHz bandwidth components in both 1550 and 1310 nm wavelengths.

Download White Paper
File: Wideband_Modulator_Detector_Characterization.pdf (597.87 KB)
To download this white paper, please complete the *required fields before clicking the "Download" button.
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Download", you agree that your personal contact information may be shared with Anritsu Co. and they may contact you about their products and services in the future. You also agree that Photonics Media may contact you with information related to this request, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required
AnritsuTest & Measurementoptical modulatorsdetectorsEye Diagramtime domainOE/EOOEEOoptical-electricalelectrical-opticalmicrowavecomponentsVNAvectorprogagation
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.