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IEC Names NanoEngineering Advisory Council

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CHICAGO, Dec. 26 -- The International Engineering Consortium (IEC)has named thirteen members to its new NanoEngineering Advisory Council, a board of leading technologists, scientists, academics and industry professionals dedicated to the advancement of nanotechnology in the engineering disciplines. NEAC members will guide and oversee the IEC's initiatives to develop educational programs to introduce nanotechno0logy to practicing engineers and to "create the intellectual infrastructure required to translate ground-breaking nanotechnology research into successful commercial applications," the IEC said.

The new NEAC members are:  

Orlando Auciello, senior scientist, Argonne National Laboratory

Ralph Cavin, vice president, research operations, Semiconductor Research Corp.

Lynn Foster, director of technology consulting, Larta

Stephen Goodnick, professor and chair, Department of Electrical Engineering, Arizona State University, and vice president, Electrical and Computer Engineering Department Heads Association

Herb Goronkin, director, physical research laboratories, Motorola

Tim E. Harper, CEO, CMP Cientifica, and executive director, European NanoBusiness Association

Sandeep Malhotra, vice president of corporate and business development, Nanotechnology

Sean Murdock, executive director, AtomWorks

Wolfgang Porod, professor of electrical engineering, and director of the Center for Nano Science and Technology, University of Notre Dame; vice president for publications, Institute of Electrical and Electronics Engineers Nanotechnology Council.

Mihail Roco, senior advisor for nanotechnology, National Science Foundation, and chair, National Science, Engineering and Technology Council's Subcommittee on Nanoscale Science, Engineering and Technology

Rodney Ruoff, professor, Northwestern University

Richard Schwartz, professor and co-director, Birck Nanotechnology Center, Purdue University

Barry Sullivan, director, content development, International Engineering Consortium

For more information, visit: www.iec.org

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Published: December 2002
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