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Grants Boost Photonics, Nano Projects

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GAITHERSBURG, Md., Sept. 30 -- Several photonics- and nanotechnology-related companies are recipients of grants from The US Commerce Department's Advanced Technology Program (ATP) for research on highly innovative industrial technologies. (See also"Quantum Dot Awarded NIST Grant," Photonics.com, Sept. 29)

A total of 43 companies, including seven joint ventures, are involved in the new projects, which were chosen on the basis of difficulty, technical innovation and the potential for significant benefits to the nation's economy. The ATP is managed by the National Institute of Standards and Technology (NIST).

Among the recipients are 3DGeo Development Inc., of Santa Clara, Calif., to develop seismic imaging technology; Carbon Nanotechnologies Inc., of Houston, Texas, for a novel, free-standing single-wall carbon nanotube electrode assembly; Corning Inc., of Corning, N.Y., for scalable planar solid-oxide fuel cell technology for beyond 200 kW; Cree Inc., of Durham, N.C., for development of a white LED that would more than quadruple the brightness and double the efficiency of existing LED systems and significantly reduce the cost per lumen; and Crystal IS Inc., of Latham, N.Y., to develop processes for growing large, single-crystal aluminum nitrides.

Also: Multibeam Systems Inc., of Santa Clara, for new technology for a multiple-beam, linear-array electron-beam lithography system; Nanospectra Biosciences Inc., of Houston, for an integrated approach to the diagnosis and treatment of cancer using near-infrared absorbing nanoparticles; OFS Fitel LLC, of Murray Hill, N.J., to develop a new class of components and manufacturing technologies for building high-power pulsed optical-fiber-based lasers; Star Cryoelectronics LLC, of Santa Fe, N.M., for a next-generation energy-dispersive microcalorimeter spectrometer for high-resolution x-ray microanalysis; and Dow Chemical Company, of Midland, Mich., to develop an atomic force microscopy-based platform for high-speed, high-bandwidth quantitative nanomechanical measurements.

For a complete list and details, visit: www.nist.gov/public_affairs/releases/atpaward09-04.htm

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Published: September 2004
Advanced Technology ProgramBasic ScienceindustrialMicroscopyNational Institute of Standards and TechnologyNews & FeaturesNISTspectroscopy

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