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Nanometrics Founder Exits Board

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Nanometrics Inc. of Milpitas, Calif., a supplier of process control metrology systems to the semiconductor industry, announced that company founder Vincent Coates has resigned as vice chairman of its board of directors. In 1995, SEMI recognized him with a lifetime achievement award for his work in scanning electron microscopy, and currently he holds more than 20 US patents. He developed the first NanoSpec as a general-purpose instrument targeted at biotechnology and industrial applications, deciding later to focus primarily on the semiconductor industry. Coates, who founded Nanometrics in 1975, will be replaced on the board by Norman Coates.
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Published: September 2009
Glossary
metrology
Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
process control
The collection and analysis of data relevant to monitoring the rate and quality of industrial production, either continuously or in batches. Corrections can be made manually or automatically, via a feedback control loop.
scanning electron microscopy
Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
biotechnologyBusinessindustrialmetrologyMicroscopyNanometricsnanospecNews BriefsNorman CoatespatentPhotonics Tech Briefsprocess controlresignscanning electron microscopySEMIsemiconductorsVincent Coates

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