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SEM Basics

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JEOL Ltd. has released a 31-page publication titled SEM: Scanning Electron Microscope A to Z: Basic Knowledge for Using the SEM. Available for download on the JEOL USA Web site, the booklet covers the basic operating principle of the microscope as well as image display, the role of secondary and backscattered electron detectors, and the vacuum system. Other topics, such as the edge effect and the influence of accelerating voltage, also are considered.
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Published: November 2009
Glossary
scanning electron microscope
An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
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