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Asylum Research Installs First Cypher AFM in China

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Asylum Research recently installed the first of its Cypher atomic force microscope systems in China. The system was installed in the lab of Xingsen Gao at South China Normal University’s Institute for Advanced Materials in Guangzhou. Gao’s group will use the instrument to investigate advanced piezoelectric, ferroelectric and multiferroic materials.


Left to right: Amir Moshar of Asylum Research, Xingsen Gao of South China Normal University, David Beck of Asylum Research, and Yan Feng and George Jiang of Asylum’s Chinese partner, Hangzhou Gelan Pa Technology Co. Ltd., with the newly installed Cypher atomic force microscope. (Image: Asylum Research)

“We chose Cypher because of its true atomic resolution and sophisticated PFM (piezoresponse force microscopy) imaging techniques,” Gao said. “We are planning to use it as a stable and powerful platform for probing various nanoscale properties on multifunctional materials with integration of other electrical characterization methods.”

According to the company, the Cypher AFM has the highest resolution of all such microscopes, providing low-drift closed-loop atomic resolution and support for all major scanning modes.

For more information, visit: www.asylumresearch.com  
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Published: August 2011
Glossary
ferroelectric materials
Ferroelectric materials are a type of dielectric materials that exhibit spontaneous electric polarization, meaning they possess a permanent electric dipole moment even in the absence of an external electric field. This polarization arises from the alignment of electric dipoles within the material, which can be spontaneously oriented in a particular direction, typically along one of the crystallographic axes. Key characteristics of ferroelectric materials include: Spontaneous polarization:...
AFMAmericasAsia-PacificAsylum ResearchBasic ScienceBusinessCaliforniaChinaCypher AFMCypher atomic force microscopeferroelectric materialsImagingMicroscopymultiferroic materialsnanoscale properties on multifunctional materialsPFMpiezoelectric materialspiezoresponse force microscopy imaging techniquesSouth China Normal University Institute for Advanced MaterialsXingsen Gao

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