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Nikon, JEOL to Collaborate on Light-Electron Microscope

Photonics.com
Nov 2014
MELVILLE, N.Y., Nov. 17, 2014 — Nikon Instruments Inc. and JEOL have joined forces to research and develop systems that combine light and electron microscopy.

Existing light microscopes cannot provide the molecular-level information that an electron microscope can. And electron microscopes are traditionally restricted to nonliving samples, which is not a limitation for light microscopy. This collaboration will ultimately combine the advantages that each technology provides.

The new team will work to develop a macro-to-molecular imaging solution that brings together Nikon’s light-based, multiphoton and superresolution microscopes and JEOL’s EM technologies.

For more information, visit www.nikoninstruments.com.

BusinesssuperresolutionimagingMicroscopyAmericasNikonJEOL

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