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Hamamatsu Corp. - Earth Innovations LB 2/24

Nondestructive Inspection: Choosing the Right Microfocus X-ray Source and Detector

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Advances in the design of microfocus x-ray sources and the flat panel sensors used with them offer higher performance to industrial inspection applications.

John Gilmore, Hamamatsu Corp.

Of all nondestructive test methods, only x-ray technology enables visual detection of defects beneath the surface of opaque components, assemblies and finished products. This has made it an essential tool in multiple manufacturing sectors, including aerospace and automotive, as well as in medical imaging. A new generation of the technology centers around microfocus x-ray sources that offer much smaller spot sizes than more traditional alternatives while maintaining the necessary output power. In addition, advances in digital detection, such as CCDs, amorphous silicon and CMOS sensors, have...Read full article

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    Published: June 2004
    aerospaceassembliesCCDCMOS sensorsConsumerFeaturesindustrialmedical imagingopaque componentsSensors & Detectorsx-ray technology

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