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Veeco to Create Deposition Tool

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WOODBURY, N.Y., July 2 -- Veeco Instruments Inc. announced it has launched a program to develop a next-generation data storage thin-film head sensor deposition tool to facilitate the transition to perpendicular recording. Veeco has hired Piero Sferlazzo as vice president and general manager for its advanced technologies deposition platform. Sferlazzo founded a number of companies, including Fluens, Opnetics (now part of Unaxis), Klee (now part of Astex Corp.) and Krytek (now part of Core Systems), and is experienced in the development and management of process equipment for the semiconductor,...Read full article

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    Published: July 2004
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    atomic layer depositionBasic ScienceCommunicationsdeposition toolmetrologyNews & Featuresphysical vapor depositionSensors & Detectorsthin-film head sensorVeecoVeeco Instruments

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