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Caltech Reports Nanotech Advance

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PASADENA, Calif., Aug. 26 -- A research project funded by Arrowhead Research Corp. has resulted in a reported breakthrough in carbon nanotube technology. The California Institute of Technology (Caltech) has filed for patent protection on an invention, and Arrowhead has the right to obtain an exclusive license from Caltech. Arrowhead and its subsidiaries have a portfolio of nanotech intellectual property comprising approximately 100 US and foreign patents and patent applications. In an article published in Nano Letters, an American Chemical Society publication, a team of researchers at Caltech...Read full article

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    Published: August 2004
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    American Chemical SocietyArrowhead Researchatomic force microscopeBasic ScienceCalifornia Institute of TechnologyCaltechcarbon nanotubeMicroscopyNews & Features

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