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Hamamatsu Corp. - Earth Innovations LB 2/24

Direct Subangstrom Resolution Demonstrated

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A team of scientists from Oak Ridge National Laboratory in Tennessee and Nion Co. in Kirkland, Wash., has used an aberration-corrected scanning transmission electron microscope to directly resolve subangstrom features in a silicon crystal lattice. The achievement, reported in the Sept. 17 issue of Science, suggests the potential of the technology to offer greater insights into the atomic-scale origins of material properties. Subangstrom imaging has been achieved indirectly in a transmission electron microscope by processing a series of images to correct for spherical aberration, but the...Read full article

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    Published: October 2004
    aberration-corrected scanning transmission electron microscopeAs We Go To PressBasic ScienceBreaking NewsMicroscopyNion Co.Oak Ridge National LaboratoryPresstime Bulletinsilicon crystal lattice

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