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Scanning Electron Microscopist Honored

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CAMBRIDGE, England, Dec. 17 -- About 120 scientists and engineers from around the world gathered last week at Cambridge University to celebrate a half-century of achievement in scanning electron microscopy (SEM) and look at future developments in SEM techniques and applications. The occasion was the centenary of professor Sir Charles Oatley, known as the father of scanning electron microscopy. Between 1951 and 1961, Oatley's team of engineering PhD students built the world's first five SEMs. They developed the first commercial SEM, the StereoScan, in 1965 with the Cambridge Instrument Company...Read full article

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    Published: December 2004
    Glossary
    scanning electron microscopy
    Scanning electron microscopy (SEM) is an advanced imaging technique used in microscopy to obtain high-resolution, three-dimensional images of the surfaces of solid specimens. SEM achieves this by using a focused beam of electrons to scan the specimen's surface, resulting in detailed images with magnifications ranging from about 10x to 100,000x or higher. Key features and principles of scanning electron microscopy include: Electron beam: SEM uses an electron beam instead of visible light for...
    Cambridge UniversityCarl ZeissMicroscopyNews & Featuresscanning electron microscopySEMSir Charles OatleyStereoScan

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