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Probe Brings Higher Throughput, Resolution to Near-Field Microscopy

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Richard Gaughan, Contributing Editor

A team at the University of Alberta in Edmonton, Alberta, Canada, recently evaluated novel designs for near-field scanning optical microscope probes that provide both high throughput and high resolution. The results of the work suggest that throughput may be increased by orders of magnitude, offering benefits in biological imaging and near-field nanolithography. Near-field scanning optical microscopy captures images with a resolution well beyond the diffraction limit. The key to the resolution is in the design of the optical probe, the scanning end of the microscope. A typical probe is a...Read full article

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    Published: February 2005
    Basic ScienceFeaturesindustrialMicroscopynear-field nanolithographynear-field scanning optical microscope probesUniversity of Alberta

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