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Silver Superlens Enables Subdiffraction-Limit Imaging

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Hank Hogan

Lens resolution can never be too flat or too thin. At least, that's one conclusion that can be drawn from recent research at the University of Canterbury in Christchurch, New Zealand. Electrical and computer engineering associate professor Richard J. Blaikie and graduate student David O.S. Melville have demonstrated resolution below the conventional diffraction limit for far-field imaging using a 50-nm-thick silver layer with a roughness of approximately 1 nm. Using a 50-nm-thick silver slab, researchers imaged a 145-nm-period grating with 365-nm radiation. ©OSA. The limit to conventional...Read full article

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    Published: May 2005
    Basic Sciencefar-field imagingindustrialLens resolutionMicroscopyResearch & Technologysilver layerUniversity of Canterbury

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