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Controller Speeds Atomic Force Microscopy

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Anne L. Fischer

The speed of operation of the atomic force microscope (AFM) is being pushed in biological and other applications where milliseconds count. Obtaining accurate sample profiles is still a limiting factor in the fast operation of AFMs. Now researchers from the University of Illinois at Urbana-Champaign, Iowa State University in Ames and IBM Zurich Research Laboratory in Rüschlikon, Switzerland, have proposed an approach that provides accurate sample topography reconstruction to boost scanning speeds. AFMs work by scanning the sample surface using a silicon cantilever with an ultrasharp tip....Read full article

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    Published: October 2005
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    atomic force microscopeBasic SciencebiologicalFeaturesMicroscopySensors & Detectorssilicon cantilever

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