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Fourier Transform Infrared Spectroscopy Exposes Self-Assembly
of Mesoporous Thin Films

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Richard Gaughan

The low index of refraction and ultralow dielectric constant of mesoporous ceramic thin films make the materials of interest for a variety of applications in optics and electronics. Now a spectroscopic technique has demonstrated the ability to monitor the self-assembly processes involved in the formation of these thin films. Plinio Innocenzi of Università di Sassari in Alghero, Italy, in collaboration with the laboratory of infrared synchrotron light at the Instituto Nazionale di Fisica Nucleare in Frascati, Italy, has led the development of a time-resolved Fourier transform infrared...Read full article

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    Published: July 2006
    Basic ScienceConsumerFeaturesMicroscopySensors & Detectorsspectroscopy

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