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Tethered AFM Offers Operators More Flexibility

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Michael D. Wheeler

A researcher at the National Research Council of Canada has adapted a commercial atomic force microscope (AFM) to perform near-field scanning in a tethered mode. This could have a significant impact on testing photonic devices such as waveguides and ridge diode lasers that do not fit under conventional AFMs. Several years ago, senior scientist Rod Taylor began converting an AFM from Digital Instruments Inc. to use in near-field scanning. Although the concept behind near-field scanning optical microscopy has been around for the better part of a century, only a select number of researchers have...Read full article

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    Published: March 1999
    Basic ScienceCommunicationsMicroscopyResearch & TechnologyTech Pulse

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