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Janos Acquired by Fluke

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KEENE, NH, Aug. 29, 2008 -- Precision infrared optics manufacturer Janos Technology of Keene, N.H., announced today it has been acquired by electronic test tools and software maker Fluke Corp., a Danaher company. Specific terms of the deal, which was finalized Aug. 28, were not disclosed. The company said it will continue to operate as Janos Technology as part of Fluke's Thermal Imaging business unit, serving the defense/aerospace, infrared imaging, analytical instruments, OEM optics and assemblies markets. In 1998, conglomerate Danaher acquired Everett, Wash.-based Fluke, which develops low-voltage and...Read full article

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    Published: August 2008
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    photonics
    The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
    thermal imaging
    The process of producing a visible two-dimensional image of a scene that is dependent on differences in thermal or infrared radiation from the scene reaching the aperture of the imaging device.
    assembliesDanaherdefenseEmploymentFlukeFluke Corp.handheldImaginginfrared opticsJanos TechnologymetrologyNews & FeaturesOpticsphotonicsTest & Measurementthermal imaging

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